METHOD FOR PREPARING SILICIDE OF A SEMICONDUCTOR DEVICE AND A SOURCE/DRAIN FOR USE IN THE SEMICONDUCTOR DEVICE

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United States of America Patent

APP PUB NO 20150279737A1
SERIAL NO

14670995

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Abstract

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Provided herein is a method for forming silicide of a semiconductor device and a source/drain for use in the semiconductor device, the method including preparing a silicon substrate that includes silicon; depositing ytterbium, refractory metal and transition metal nitride on the silicon substrate so that the ytterbium and the refractory metal form an ytterbium alloy thin film and the transition metal nitride form a capping layer; and heating the silicon substrate to form ytterbium silicide on an interface between the silicon substrate and the ytterbium alloy thin film.

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Patent Owner(s)

Patent OwnerAddress
RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITYCORPORATE COLLABORATION CENTER SUNGKYUNKWAN UNIVERSITY 2066 SEOBU-RO JANGAN-GU GYEONGGI-DO SUWON-SI 16419

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KANG, Jun Gu Seoul, KR 10 7
LEE, Hoojeong Suwon-si, KR 5 18
NA, Sekwon Seoul, KR 2 3

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