X-ray transmission inspection apparatus

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United States of America Patent

PATENT NO 9863896
SERIAL NO

14674133

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Abstract

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An X-ray transmission inspection apparatus includes: an X-ray source configured to irradiate a sample with an X-ray; a detector configured to be disposed on a side opposite to the X-ray source with respect to the sample and to detect the X-ray which is transmitted through the sample using a phosphor; a shield member configured to be arranged to face a detection surface of the detector and to block a part of X-rays to partially form a shield area from the X-rays on the detection surface; and a shield moving mechanism configured to move the shield member relative to the detector to enable change of a position of the shield area.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH SCIENCE CORPORATION24-14 NISHI-SHIMBASHI 1-CHOME MINATO-KU TOYKO 105-0003

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Matoba, Yoshiki Tokyo, JP 35 226

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