METHOD AND DEVICE FOR ANALYZING ION STRUCTURE
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United States of America Patent
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Issued Date -
Sep 17, 2015
app pub date -
Feb 26, 2015
filing date -
Mar 12, 2014
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Abstract
The disclosure provides a device and a method for analyzing an ion structure, comprising: pre-processing a time domain signal of a mirror current of ions to be measured that are obtained from an ion mass analyzer, to obtain a signal to be measured; extracting information about a position a spectral signal of the signal to be measured through a Fourier transforming: modulating the spectral peak signal, to obtain a modulated signal; filtering the modulated signal, to obtain a filtered signal; estimating parameters of an ion motion model with respect to the filtered signal, to determine information on structural characteristics of the ions to be measured from the estimated parameters. According to the device and the method for analyzing an ion structure of the present disclosure, the ion structures may be analyzed by directly analyzing the time domain signal of the mirror current of the ion.
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