MEMORY TEST ECC AUTO-CORRECTION OF FAILING DATA

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United States of America Patent

APP PUB NO 20150255176A1
SERIAL NO

14202929

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method according to one embodiment of the present invention for evaluating test results for a memory module. The method comprises reviewing contents of a test data stream for one or more sections of the memory module. A first counter is incremented when a defective portion is encountered in the test data stream for a first section of the one or more sections of the memory module. Each defective portion of the first section is marked as good in the test data stream so long as a first counter value is equal to or below a first threshold value. Data from the test data stream identifying defective portions of the first section are stored in an error cache for each remaining defective portion of the first section identified after the first counter passes a first threshold value.

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Patent Owner(s)

Patent OwnerAddress
ADVANTEST CORPORATIONTOKYO 179-0071

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HYDER, Matt Boise, US 2 9
JONES, Michael San Carlos, US 223 5291
KRECH,, JR Alan S Fort Collins, US 6 21
LAI, Ken Hanh Duc Sunnyvale, US 6 31

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