Shape Inspecting Device And Shape Inspecting Method
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United States of America Patent
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Issued Date -
Sep 10, 2015
app pub date -
Jan 21, 2015
filing date -
Mar 5, 2014
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Abstract
Information concerning a height of a shape of a workpiece is acquired accurately at high speed. A plurality of segments arrayed in one direction are set on a distance image including height information in a surface shape of a workpiece (S1). A type of a representative value concerning height information in each pixel included in each segment is selected, and this selected representative value is obtained for each segment (S2). An abnormality in a specific representative value is detected from an acquired trend, and is outputted (S4).
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