Fast on-chip oscillator trimming
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United States of America Patent
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May 17, 2016
Grant Date -
Sep 3, 2015
app pub date -
Feb 28, 2014
filing date -
Feb 28, 2014
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Abstract
Oscillation frequency measurements for trimming oscillators on an integrated circuit device are performed entirely on the device. The oscillation frequency measurements utilize a reference clock. Some measurements count periods of the oscillator signal independently of the reference clock, and some measurements count periods of the reference clock independently of the oscillator signal. After one oscillator on the device has been trimmed, that trimmed oscillator may then be used to make oscillation frequency measurements for trimming another oscillator on the device.
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