Semiconductor Multilayer Structure And Semiconductor Element

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United States of America Patent

APP PUB NO 20150249189A1
SERIAL NO

14633084

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Abstract

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A semiconductor multilayer structure includes a β-Ga2O3-based single crystal substrate including a dislocation density on a main surface of not more than 1×103/cm2; and a nitride semiconductor layer including an AlxGayInzN (0≦x≦1, 0≦y≦1, 0≦z≦1, x+y+z=1) crystal epitaxially grown on the β-Ga2O3-based single crystal substrate.

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Patent Owner(s)

Patent OwnerAddress
TAMURA CORPORATIONTOKYO 178-8511
KOHA CO LTD6-8 KOUYAMA 2-CHOME NERIMA-KU TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
SATO, Shinkuro Tokyo, JP 7 8

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