Aberration corrector and charged particle beam apparatus using the same

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United States of America Patent

PATENT NO 9287084
APP PUB NO 20150248944A1
SERIAL NO

14607736

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Provided are an aberration corrector that reduces irregularity of a magnetic field of a multipole to obtain an image of high resolution and a charged particle beam apparatus using the same. The aberration corrector includes a plurality of magnetic field type poles, a ring that magnetically connects the plurality of poles with one another and an adjustment member disposed between the pole and the ring to adjust a spacing between the pole and the ring per pole.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH CORPORATION17-1 TORANOMON 1-CHOME MINATO-KU TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Baba, Hiroaki Tokyo, JP 5 29
Cheng, Zhaohui Tokyo, JP 33 200
Kashima, Hideo Tokyo, JP 36 992
Nakano, Tomonori Tokyo, JP 29 281
Ohashi, Takeyoshi Tokyo, JP 22 92
Suzuki, Naomasa Tokyo, JP 58 671
Urano, Kotoko Tokyo, JP 8 34

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