Calibration plate for measuring calibration of a digital microscope and methods of using the same

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United States of America Patent

PATENT NO 10451862
APP PUB NO 20150248003A1
SERIAL NO

14230803

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Abstract

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A calibration plate for measuring calibration of digital microscope and methods of using the same. The calibration plate comprises at least one calibration area formed with a surface structure which includes a plurality of grid cells arranged periodically, wherein at least part of boundary and/or at least part of apexes of each grid cell can be identified by an optical imaging system of the digital microscope. The invention also includes a digital microscope system equipped with the calibration plate.

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Patent Owner(s)

Patent OwnerAddress
CARL ZEISS MICROSCOPY GMBHJENA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gu, Hailei Shanghai, CN 3 4
Li, Zhongyu Shanghai, CN 12 13
Nagel, Patrick Reutlingen, DE 3 3

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