Microbolometer contact systems and methods
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United States of America Patent
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May 23, 2017
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N/A
app pub date -
May 11, 2015
filing date -
Oct 9, 2009
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Abstract
Systems and methods are directed to contacts for an infrared detector. For example, an infrared imaging device includes a substrate having a first metal layer and an infrared detector array coupled to the substrate via a plurality of contacts. Each contact includes for an embodiment a plurality of metal studs each having a first end and a second end and each disposed between the first metal layer and a second metal layer, wherein the first end of each metal stud is disposed on a portion of the first metal layer that is at least partially on the surface of the substrate.
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