LOW-TEMPERATURE SELECTIVE EPITAXIAL GROWTH OF SILICON FOR DEVICE INTEGRATION

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United States of America Patent

SERIAL NO

14711403

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Abstract

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An epitaxy method includes providing an exposed crystalline region of a substrate material. Silicon is epitaxially deposited on the substrate material in a low temperature process wherein a deposition temperature is less than 500 degrees Celsius. A source gas is diluted with a dilution gas with a gas ratio of dilution gas to source gas of less than 1000.

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Patent Owner(s)

Patent OwnerAddress
INTERNATIONAL BUSINESS MACHINES CORPORATIONNEW ORCHARD ROAD ARMONK NY 10504

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HEKMATSHOAR-TABARI, BAHMAN MOUNT KISCO, US 53 2511
KHAKIFIROOZ, ALI LOS ALTOS, US 843 12822
REZNICEK, ALEXANDER MOUNT KISCO, US 1451 12717
SADANA, DEVENDRA K PLEASANTVILLE, US 897 10959
SHAHIDI, GHAVAM G POUND RIDGE, US 396 8896
SHAHRJERDI, DAVOOD OSSINING, US 247 4747

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