Optical Measurement Device And Probe System
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Sep 3, 2015
app pub date -
Sep 19, 2013
filing date -
Sep 24, 2012
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
An optical measurement device provided with: a first adjustment optical device for collecting radiation light received by a probe that emits measurement light to a measurement target and receives radiation light radiated from the measurement target, and for emitting the radiation light toward the spectroscope for dividing the radiation light; a detection section for detecting a light intensity distribution of the radiation light; a movement part for moving the first adjustment optical device in a light axis direction of the radiation light and on a plane perpendicular to the light axis direction of the radiation light; and a control section for controlling the movement part. The first adjustment optical device is moved in the light axis direction of the radiation light and on the plane on a basis of a detection result of the detection section such that a reception amount of the radiation light increases.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully