OPTICAL PROBE, OPTICAL MEASUREMENT METHOD, AND OPTICAL MEASUREMENT DEVICE
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
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N/A
Issued Date -
Sep 3, 2015
app pub date -
Jul 23, 2012
filing date -
Feb 15, 2012
priority date (Note) -
Abandoned
status (Latency Note)
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Importance

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Abstract
An optical probe 10 includes an optical fiber 11, an optical connecter 12 being connected to the optical fiber 11, a focusing optical system 13 and a deflection optical system 14 each being connected to the optical fiber 11, a support tube 15 and a jacket tube 16 each surrounding the optical fiber 11 to extend along the optical fiber 11, and a buffer fluid 17 filled in the inner lumen of the jacket tube. The optical fiber 11 has a cutoff wavelength shorter than 1.53 μm. The optical fiber 11, the focusing optical system 13, the deflection optical system 14, and the buffer fluid 17 and jacket tube 16 on an optical path coupled to a fundamental mode of the optical fiber each have the light transmittance of −2 dB to 0 dB in a wavelength band of 1.6 μm to 1.8 μm.
First Claim
all claims..Other Claims data not available
Family
Country | kind | publication No. | Filing Date | Type | Sub-Type |
---|---|---|---|---|---|
JP | B1 | JP5120509 | Feb 15, 2012 | Patent | Grant |
Type : Patent Sub-Type : Grant | |||||
PUBLISHED GRANTED PATENT | OPTICAL PROBE AND OPTICAL MEASURING METHOD | Jan 16, 2013 | |||
EP | A1 | EP2803973 | Jul 23, 2012 | Patent | Application |
Type : Patent Sub-Type : Application | |||||
APPLICATION PUBLISHED WITH SEARCH REPORT | OPTICAL PROBE AND OPTICAL MEASUREMENT METHOD | Nov 19, 2014 | |||
WO | A1 | WO2013121602 | Jul 23, 2012 | Patent | Application |
Type : Patent Sub-Type : Application | |||||
INTERNATIONAL APPLICATION PUBLISHED WITH INTERNATIONAL SEARCH REPORT | 光プローブおよび光学的測定方法 | Aug 22, 2013 | |||
CN | A | CN104126111 | Jul 23, 2012 | Patent | Application |
Type : Patent Sub-Type : Application | |||||
UNEXAMINED APPLICATION FOR A PATENT FOR INV. | Optical probe and optical measurement method | Oct 29, 2014 | |||
KR | A | KR20140123591 | Jul 23, 2012 | Patent | Application |
Type : Patent Sub-Type : Application | |||||
UNEXAMINED PATENT APPLICATION | OPTICAL PROBE AND OPTICAL MEASUREMENT METHOD | Oct 22, 2014 |
- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
SUMITOMO ELECTRIC INDUSTRIES LTD | 5-33 KITAHAMA 4-CHOME CHUO-KU OSAKA-SHI OSAKA 5410041 ?5410041 |
International Classification(s)

- 2012 Application Filing Year
- A61B Class
- 9956 Applications Filed
- 8866 Patents Issued To-Date
- 89.06 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Hasegawa, Takemi | Yokohama-shi, JP | 74 | 520 |
# of filed Patents : 74 Total Citations : 520 | |||
Hirano, Mitsuharu | Yokohama-shi, JP | 18 | 62 |
# of filed Patents : 18 Total Citations : 62 | |||
Tanaka, Masato | Yokohama-shi, JP | 502 | 4885 |
# of filed Patents : 502 Total Citations : 4885 |
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Patent Citation Ranking
- 11 Citation Count
- A61B Class
- 52.52 % this patent is cited more than
- 10 Age
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11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Mar 3, 2027 |
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Surcharge - 11.5 year - Late payment within 6 months | $160.00 | $80.00 | $40.00 |
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
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