OPTICAL PROBE, OPTICAL MEASUREMENT METHOD, AND OPTICAL MEASUREMENT DEVICE

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United States of America Patent

APP PUB NO 20150245768A1
SERIAL NO

14373342

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Abstract

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An optical probe 10 includes an optical fiber 11, an optical connecter 12 being connected to the optical fiber 11, a focusing optical system 13 and a deflection optical system 14 each being connected to the optical fiber 11, a support tube 15 and a jacket tube 16 each surrounding the optical fiber 11 to extend along the optical fiber 11, and a buffer fluid 17 filled in the inner lumen of the jacket tube. The optical fiber 11 has a cutoff wavelength shorter than 1.53 μm. The optical fiber 11, the focusing optical system 13, the deflection optical system 14, and the buffer fluid 17 and jacket tube 16 on an optical path coupled to a fundamental mode of the optical fiber each have the light transmittance of −2 dB to 0 dB in a wavelength band of 1.6 μm to 1.8 μm.

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Patent Owner(s)

Patent OwnerAddress
SUMITOMO ELECTRIC INDUSTRIES LTDOSAKA-SHI OSAKA 541-0041

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hasegawa, Takemi Yokohama-shi, JP 74 520
Hirano, Mitsuharu Yokohama-shi, JP 18 62
Tanaka, Masato Yokohama-shi, JP 502 4885

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