Production line monitoring device

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United States of America Patent

PATENT NO 9818236
SERIAL NO

14425424

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Abstract

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A production line monitoring device that identifies a cause of a production defect, reduces the amount of analysis data and computation, and performs real-time processing, is provided. The production line monitoring device includes a defect indication detection unit that detects an indication of a production defect of a production line, and a defect cause identification unit that identifies a cause of the production defect. The defect indication detection unit collects measurement information measured by an inspection apparatus for each reference that identifies a position on products, and detects an indication of the production defect from the change with time of the measurement information at the references. The defect cause identification unit performs stratified analysis based on production information related to the reference when the defect indication detection unit detects an indication of a production defect, and identifies a cause of a production defect from a result of the analysis.

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Patent Owner(s)

Patent OwnerAddress
FUJI CORPORATION19 CHAUSUYAMA YAMAMACHI AICHI CHIRYU 472-8686

International Classification(s)

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  • 2012 Application Filing Year
  • G07C Class
  • 330 Applications Filed
  • 303 Patents Issued To-Date
  • 91.82 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances201220132014201520162017201820192020202120220255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nakayama, Daisuke Toyokawa, JP 105 662

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges214121101 - 1011 - 2021 - 3041 - 5081 - 900123456789101112131415

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