Metrological scale
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Sep 19, 2017
Grant Date -
Aug 27, 2015
app pub date -
May 8, 2015
filing date -
Apr 21, 2008
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method of applying a marking onto a metrological scale. The method includes locating one or more markings on the scale substrate in a provisional state; checking whether the one or more markings located on the scale substrate are acceptable; and finalizing the one or markings which are acceptable so as to transform the one or more markings into a finalized state.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully