TEST METHOD AND DEVICE
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United States of America Patent
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Issued Date -
Aug 20, 2015
app pub date -
Feb 18, 2014
filing date -
Feb 18, 2014
priority date (Note) -
Abandoned
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Abstract
Methods, devices and electronic components are disclosed, including a method of testing an integrity of a reduced gas pressure region at at least part of an electronic device, the method comprising applying a first current or voltage to a conductor, wherein the conductor includes at least one thermocouple formed on the device, and measuring an electrical property of the device.
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