SYSTEMS AND METHODS FOR QUANTIFYING MULTIPLE REFRACTIONS WITH DIFFRACTION ENHANCED IMAGING
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United States of America Patent
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Aug 13, 2015
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Feb 12, 2015
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Feb 12, 2014
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Systems and methods for detecting small angular changes in an X-ray beam caused by multiple refractions within an object. According to an aspect, a method for detecting an image of an object includes providing a single X-ray source. The method also includes generating a first X-ray beam. Further, the method includes positioning monochromator crystals to intercept the first X-ray beam such that second X-ray beams are produced. The method also includes positioning an object in paths of the second X-ray beams for transmission of the second X-ray beams through the object and emitting from the object transmitted X-ray beams. The method also includes directing the transmitted X-ray beams at angles of incidence on analyzer crystals, wherein the angles of incidence of the analyzer crystals are independently adjustable. Further the method includes detecting an image of the object from each of the X-ray beams diffracted from the analyzer crystals.
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