OPTICAL PROBE, ATTACHABLE COVER, AND SHAPE MEASURING APPARATUS

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United States of America Patent

APP PUB NO 20150226544A1
SERIAL NO

14612480

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Abstract

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An optical probe includes a probe cover, within which is installed an optical system having an illuminating optical system and a receiving optical system. An emitting region and an incidence region through which light passes are provided to a bottom surface of the probe cover, the bottom surface forming an opposing region opposite a work piece. In addition, a light reflection prevention structure or a diffusion structure is provided to the bottom surface of the probe cover. Light reflected from the work piece is prevented from reflecting off the bottom surface by the reflection prevention structure, or the reflected light is diffused by the diffusion structure. Accordingly, an occurrence of an erroneous value in received light distribution due to second order reflected light can be inhibited.

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Patent Owner(s)

Patent OwnerAddress
MITUTOYO CORPORATION20-1 SAKADO 1-CHOME TAKATSU-KU KAWASAKI-SHI KANAGAWA 213-8533

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
IWAMOTO, Tadashi Hino, JP 34 154
MORIUCHI, Eisuke Kawasaki-shi, JP 10 55
NEMOTO, Kentaro Kawasaki-shi, JP 24 118
YAMAGATA, Masaoki Kawasaki-shi, JP 32 157

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