Wafer-scale testing of photonic integrated circuits using horizontal spot-size converters

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United States of America Patent

PATENT NO 9922887
SERIAL NO

14103659

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Abstract

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Disclosed herein are methods, structures, and devices for wafer scale testing of photonic integrated circuits.

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ACACIA TECHNOLOGY INC170 WEST TASMAN DRIVE SAN JOSE CA 95134

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Long Maynard, US 393 1067
Doerr, Christopher Maynard, US 128 1284
Vermeulen, Diedrik Maynard, US 24 168

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