Gas analysis system comprising a gas spectrometer equipped with a micro-reflectron

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United States of America Patent

PATENT NO 9696285
SERIAL NO

14419108

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Abstract

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The invention relates to a gas analysis system comprising, from upstream to downstream:

    a module (SEP) for separating at least a portion of the species contained in the gas to be analysed, comprising at least one microcapillary column (GC) for gas phase chromatography, anda time-of-flight mass spectrometer (TOFMS) coupled to said separation module, said spectrometer comprising a ion source (MS1, MS2) adapted to ionise at least a portion of said species and to emit a ion beam, and a free-flight zone (MS4) for said ions,said mass spectrometer (TOFMS) being arranged in the volume of at least one substrate and comprising a micro-reflectron (R) arranged between the source (MS1, MS2) and the free-flight zone (MS4), a wall (R1) of said micro-reflectron comprising a layer made from a resistive material designed to be polarised between at least two regions so as to create a continuous electrostatic field gradient in said reflectron.

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Patent Owner(s)

Patent OwnerAddress
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES25 RUE LEBLANC BÂTIMENT << LE PONANT D >> PARIS 75015
ANALYTICAL PIXELS TECHNOLOGY-APIX TECHNOLOGY7 PARVIS LOUIS NÉEL BÂTIMENT 52 GRENOBLE F-38000

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Andreucci, Philippe Moirans, FR 19 189
Colinet, Eric Bois Guillaume, FR 26 184
Duraffourg, Laurent Voiron, FR 35 247
Petitjean, Mélanie Grenoble, FR 2 18
Puget, Pierre Saint Ismier, FR 12 347
Stevens, Peter Thomas Springboro, US 1 7
Tassetti, Charles-Marie Paris, FR 3 35
Whiting, Joshua Springboro, US 2 18

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