MASS ANALYSIS METHOD AND MASS ANALYSIS SYSTEM
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United States of America Patent
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Issued Date -
Jul 16, 2015
app pub date -
Jul 8, 2013
filing date -
Jul 24, 2012
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Abandoned
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Abstract
Provided is a mass analysis method that prevents quantitative precision from decreasing. This mass analysis method uses an analysis system including a mass analysis device and a subdetector connected to each other, the subdetector displaying intensity and detection time relating to constituents of a sample at a preceding stage of the mass analysis device, the method comprising: (a) after injection of a sample, analyzing the sample with an analyzing apparatus including the subdetector, and after the sample has passed through the subdetector, injecting the sample into the mass analysis device; (b) acquiring data from both the subdetector and the mass analysis device; and (c) determining which of peaks that the subdetector and the mass analysis device have detected is to be analyzed, based on whether overlapping peaks are present and whether the same peak between data from the subdetector and the mass analysis device is present.
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