III NITRIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

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United States of America Patent

APP PUB NO 20150187887A1
SERIAL NO

14412916

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Provided is a III nitride semiconductor device higher heat dissipation performance, and a method of manufacturing a III nitride semiconductor device which makes it possible to fabricate such a III nitride semiconductor device at higher yield. In a method of a III nitride semiconductor device, a semiconductor structure obtained by sequentially stacking an n-layer, an active layer, and a p-layer is formed on a growth substrate; a support body including a first support electrically connected to an n-layer to serve as an n-side electrode, a second support electrically connected to a p-layer to serve as a p-side electrode, and structures made of an insulator for insulation between first and second supports is formed on the p-layer side of the semiconductor structure; and the growth substrate is separated using a lift-off process. The first support and the second support are grown by plating.

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Patent Owner(s)

Patent OwnerAddress
DOWA ELECTRONICS MATERIALS CO LTDTOKYO TOKYO METROPOLIS
BBSA LIMITEDUNIT A 3/F QUEEN'S CONTRO 58-64 QUEEN'S ROAD EAST WANCHAI HONG KONG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cho, Meoung Whan Yongin-City, KR 19 112
Jang, Pil Guk Yongin-City, KR 6 34
Kadowaki, Yoshitaka Akita-shi, JP 27 69
Kim, Jin Hee Yongin-City, KR 108 787
Lee, Seog Woo Yongin-City, KR 13 55
Moon, Se Young Yongin-City, KR 1 0
Rho, Ho Kyun Yongin-City, KR 1 0
Toba, Ryuichi Akita-shi, JP 28 105
Yang, Hoe Young Yongin-City, KR 1 0

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