SYNTHESIS-PARAMETER GENERATION DEVICE FOR THREE-DIMENSIONAL MEASUREMENT APPARATUS

Number of patents in Portfolio can not be more than 2000

United States of America Patent

SERIAL NO

14406591

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A plurality of units (4) constituted by a projector (6) that projects a periodic lattice onto a measurement target (1) and a camera (8) that images the projected lattice are included around the measurement target (1), and three-dimensional coordinates measured by the respective units (4) are composited by coordinate conversion. A first lattice that is displayed on a reference surface (42) is imaged, and phases with respect to the first lattice are obtained for respective pixels of the cameras (8) and stored. A second lattice is projected from the projector (6) onto the reference surface (42) and imaged, and three-dimensional coordinates of the reference surface (42) are stored for respective pixels of the cameras (8). The phases of the respective pixels of the cameras (8) are interpolated, and sub-pixels whose phases match each other between the cameras (8) are generated. Three-dimensional coordinates of the respective sub-pixels are obtained, and a compositing parameter is generated so that the three-dimensional coordinates of sub-pixels having the same phases match each other between the units (4). The accuracy of the compositing parameter for coordinate conversion is improved.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
SHIMA SEIKI MFG LTDJAPAN

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Iwai, Kazutaka Wakayama-shi, JP 2 9
Shimo, Kosuke Wakayama-shi, JP 1 3

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation