Ionization System for Charged Particle Analyzers
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United States of America Patent
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Issued Date -
Jun 25, 2015
app pub date -
Dec 20, 2013
filing date -
Dec 20, 2013
priority date (Note) -
Abandoned
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Abstract
A sample ionization system includes at least an ionization source disposed at an ion source end of a charged particle analyzer, for selectably generating first ions in an analyzing mode of operation and second ions in a cleaning mode of operation. The first ions are one of positively and negatively charged and the second ions are the other one of positively and negatively charged. The second ions are directed through the charged particle analyzer toward a surface of an ion optic component, for at least partially neutralizing a buildup of charge caused by the first ions impinging on the surface of the at least one ion optic component.
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