TEST SENSOR WITH CODE INFORMATION AND MANUFACTURING METHOD THEREOF
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United States of America Patent
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Issued Date -
Jun 25, 2015
app pub date -
Apr 23, 2014
filing date -
Dec 20, 2013
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Abandoned
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Abstract
The present invention provides a test sensor with code information and a manufacturing method thereof. The manufacturing method of the test sensor with code information includes the following steps of: determining a corresponding relationship between code information of a test sensor and resistance or capacitance of an SMD resistor or SMD capacitor; and disposing the SMD resistor or SMD capacitor with a corresponding resistance or capacitance on a middle carrying plate or a base plate. The manufacturing method provided by the invention can solidify the code information into the test sensor by only two steps, and the manufacturing process is very simple. The production costs can be reduced greatly due to the SMD resistor or SMD capacitor. Further, this manufacturing method has extremely low requirements on manufacturing environment so that large-scale production can be achieved.
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