METHOD FOR FABRICATING MULTI-TRENCH STRUCTURE

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United States of America Patent

APP PUB NO 20150175409A1
SERIAL NO

14411989

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Abstract

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Provided is a method for fabricating a multi-trench structure, including steps of: performing anisotropic etching on a semiconductor substrate so as to form a vertical trench; growing a first epitaxial layer on the semiconductor substrate in which the vertical trench has been formed, so that the first epitaxial layer covers the top of the vertical trench to form a closed structure; performing anisotropic and isotropic etching on the closed structure, so as to form a trench array, and to make the trench array communicate with the vertical trench, the trench array including a number of trenches or vias, upper portions of a number of trenches or vias being separated from each other, and lower portions thereof communicating with each other to form a cavity; and growing a second epitaxial layer to cover the trench array, so as to form a closed multi-trench structure. With two times of growth of the epitaxial layers, the multi-trench structure remains stable and solid in a fabricating process, which prevents phenomena of film breakage or falling off in the fabricating process.

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Patent Owner(s)

Patent OwnerAddress
CSMC TECHNOLOGIES FAB1 CO LTDNO 8 XINZHOU ROAD WUXI NEW DISTRICT JIANGSU 214028

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dai, Dan Jiangsu, CN 16 87
Xia, Changfeng Jiangsu, CN 22 60
Zhang, Xinwei Jiangsu, CN 18 33
Zhou, Guoping Jiangsu, CN 8 8

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