SAMPLE HOLDER FOR ELECTRON MICROSCOPY
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United States of America Patent
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Issued Date -
Jun 18, 2015
app pub date -
Dec 13, 2013
filing date -
Dec 13, 2013
priority date (Note) -
Abandoned
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Abstract
The present invention relates to an assembly for holding a sample during characterisation of said sample in an electron microscope, the assembly comprising a feedthrough, a middle portion and a tip portion, wherein the tip portion comprises a frame structure, a light handling system attached thereto, and a temperature controlling arrangement also attached to the frame structure. The present invention further relates to a tip portion for the assembly for holding the sample.
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