Memories having a built-in self-test (BIST) feature

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United States of America Patent

PATENT NO 9384856
APP PUB NO 20150162098A1
SERIAL NO

14102727

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Abstract

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A memory system includes a memory and a built-in self-test (BIST) unit coupled to the memory. The BIST unit is configured to run a test pattern on the memory to accumulate a fault signature, and store fault signature information based on the accumulated fault signature at multiple locations in the memory.

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Patent Owner(s)

Patent OwnerAddress
NXP USA INC6501 WILLIAM CANNON DRIVE WEST AUSTIN TX 78735

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Qureshi, Qadeer A Dripping Springs, US 32 741
Silveira, Reinaldo Sao Paulo, BR 5 28
Spruth, Henning F Austin, US 4 15

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