THREE-DIMENSIONAL MEASUREMENT APPARATUS, AND THREE-DIMENSIONAL MEASUREMENT METHOD
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United States of America Patent
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app pub date -
May 22, 2013
filing date -
Jun 12, 2012
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Abstract
A lattice is projected multiple times from projectors (P1; P2) onto a measurement target object (1) while being shifted, the measurement target object (1) onto which the lattice is projected is imaged by a camera (C1), and conversion into the three-dimensional shape of the measurement target object (1) is performed. Two projectors (P1; P2) are provided respectively at positions that are close to and far from the camera (C1), and, using phases obtained from images captured during projection from the projector (P1) that is provided at the position close to the camera (C1), phases obtained from images captured during projection from the projector (P2) that is provided at the position far from the camera (C1) are converted into phases by which positions in line of sight directions from the camera (C1) are uniquely indicated. The three-dimensional shape of an object is accurately measured in a short time period.
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