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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
YUKITA ELECTRIC WIRE CO LTD	1-2-11 FURUICHI JOTO-KU OSAKA-SHI OSAKA 536-0001
HUA CHENG TECHNOLOGY CO LTD	17F NO 100 SEC 1 XINTAI 5TH RD XIZHI DIST NEW TAIPEI CITY 221

International Classification(s)

• H01B:CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATER....

• 2015 Application Filing Year
• H01B Class
• 1402 Applications Filed
• 1066 Patents Issued To-Date
• 76.04 % Issued To-Date

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Makino, Hiroyuki	Tokyo, JP	47	554
# of filed Patents : 47 Total Citations : 554
Tatsumi, Shunji	Tokyo, JP	5	33
# of filed Patents : 5 Total Citations : 33
Yuuki, Yasunori	Tokyo, JP	8	142
# of filed Patents : 8 Total Citations : 142

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• 0 Citation Count
• H01B Class

• 0 % this patent is cited more than
• 9 Age

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date
11.5 Year Payment	$7400.00	$3700.00	$1850.00	Mar 27, 2028

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge - 11.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
September 27, 2016	US,9455072,B2   US9455072B2	GRANTED PATENT AS SECOND PUBLICATION
June 04, 2015	US,20150155076,A1   US20150155076A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 9606212

Systems and methods for time/frequency indexed pulse calibrations for vector network analyzers

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Abstract

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A method for measuring scattering parameters in a device under test (DUT) using a vector network analyzer (VNA), includes calibrating the VNA to generate corrections for deterministic setup defects and mapping a plurality of error terms based on a plurality of time indices, wherein each time indicia is associated with an error term. A test signal is transmitted to the DUT to obtain a measurement signal from the DUT in response to the test signal. The generated corrections to obtained measurements are time aligned based on the mapped error terms.

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Description

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Claims

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• MAFP2024
• MAFP2020
• I2017
• STCF2017
• AS2014
• AS2014
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Mar 28, 2017	I	Issuance
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Dec 22, 2014	AS	ASSIGNMENT	free format text: CORRECTIVE ASSIGNMENT TO CORRECT THE RECEIVING PARTY NAME PREVIOUSLY RECORDED ON REEL 034571 FRAME 0523. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT;ASSIGNOR:MARTENS, JON S.;REEL/FRAME:042386/0766 Owner name: ANRITSU COMPANY, CALIFORNIA Effective Date: Dec 22, 2014
Dec 22, 2014	AS	ASSIGNMENT	free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:MARTENS, JON S.;REEL/FRAME:034571/0523 Owner name: ANRITSU CORPORATION, CALIFORNIA Effective Date: Dec 22, 2014
Mar 14, 2014	F	Filing