Importance

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Abstract

The present invention discloses an automatic testing system. The automatic testing system includes a field programmable gate array (FPGA), a digital-to-analog converter (DAC), an analog-to-digital converter (ADC), and a processor. The FPGA is preprogrammed with a digital signal protocol for testing a DUT. The FPGA generates a digital testing signal in compliance with the digital signal protocol and transmits the digital testing signal to the DUT. The FPGA receives a digital signal output generated by the DUT, analyzes the digital output signal based on the digital signal protocol and obtains a digital test result. The DAC converter generates an analog testing signal to the DUT such that the DUT generates an analog signal output. The ADC measures the analog signal output and gets an analog test result. The processor receives the digital and analog test results and determines whether the functions of the DUT are correct or not.

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First Claim