Parametric control of object scanning

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United States of America Patent

PATENT NO 9857163
SERIAL NO

14523251

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Abstract

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A method of measuring an object having associated geometric data and material data receives the geometric data and material data relating to the object, and controls an x-ray device to scan the object. The x-ray device operates in accordance with a plurality of operating parameters. The method then varies at least one of the operating parameters during the scan as a function of one or both the geometric data and the material data.

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Patent Owner(s)

Patent OwnerAddress
HEXAGON METROLOGY INC250 CIRCUIT DRIVE NORTH KINGSTOWN RI 02852

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Darrouzet, Stephen West Warwick, US 5 33
O'Hare, Jonathan J Warwick, US 45 292

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