SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

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United States of America Patent

SERIAL NO

14081580

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Abstract

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The invention provides a semiconductor device, including: a substrate having a first conductivity type, including: a body region having the first conductivity type; a source region formed in the body region; a drift region having a second conductivity type adjacent to the body region, wherein the first conductivity type is opposite to the second conductivity type; and a drain region formed in the drift region; a multiple reduced surface field (RESURF) structure embedded in the drift region of the substrate; and a gate dielectric layer having a thick portion formed over the substrate, wherein the gate dielectric includes at least a stepped-shape or a curved shape curved-shape formed thereon, and wherein the multiple RESURF structure is aligned with the thick portion of the gate dielectric layer.

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Patent Owner(s)

Patent OwnerAddress
VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION123 PARK AVE-3RD HSINCHU SCIENCE PARK HSINCHU 300-77

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
SULISTYANTO, Priyono Tri Umbulharjo, ID 7 32
TU, Shang-Hui Jhubei City, TW 43 275

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