X-RAY INTERFEROMETRIC IMAGING SYSTEM
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United States of America Patent
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Issued Date -
Apr 30, 2015
app pub date -
Oct 29, 2014
filing date -
Oct 31, 2013
priority date (Note) -
Abandoned
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Abstract
We disclose an x-ray interferometric imaging system in which the x-ray source comprises a target having a plurality of structured coherent sub-sources of x-rays embedded in a thermally conducting substrate. The system additionally comprises a beam-splitting grating G1 that establishes a Talbot interference pattern, which may be a π phase-shifting grating, and an x-ray detector to convert two-dimensional x-ray intensities into electronic signals. The system may also comprise a second analyzer grating G2 that may be placed in front of the detector to form additional interference fringes, and a means to translate the second grating G2 relative to the detector.
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