ANTENNA STRUCTURES AND METHODS THEREOF FOR DETERMINING A FREQUENCY OFFSET BASED ON A REACTANCE MEASUREMENT

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United States of America Patent

SERIAL NO

14285223

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A system that incorporates the subject disclosure may include, for example, a circuit for measuring a change in reactance of an antenna, determining a frequency offset of the antenna based on a change in an operating frequency of the antenna according to the change in reactance of the antenna, and adjusting the operating frequency of the antenna to mitigate the frequency offset of the antenna. Other embodiments are disclosed.

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Patent Owner(s)

Patent OwnerAddress
ACHILLES TECHNOLOGY MANAGEMENT CO II INC400 HAMILTON AVENUE PALO ALTO CA 94301

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Caimi, Frank M Vero Beach, US 86 2892

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