TESTING METHOD, TESTING APPARATUS AND CIRCUIT FOR USE WITH SCAN CHAINS
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United States of America Patent
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Issued Date -
Apr 23, 2015
app pub date -
Oct 17, 2014
filing date -
Oct 18, 2013
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Abstract
A scan chain includes a plurality of scan chain blocks coupled together in series and reference circuitry inserted before one of the plurality of scan chain blocks. The reference circuitry, in a scan mode of operation, receives a scan input signal. In a test data capture mode of operation, the reference circuitry receives a known test signal value, and, in a scan out mode of operation, outputs the known test signal value to the one scan chain block of the plurality of scan chain blocks.
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