FABRICATION METHOD OF SEMICONDUCTOR DEVICE AND THE SEMICONDUCTOR DEVICE

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United States of America Patent

APP PUB NO 20150108539A1
SERIAL NO

14484627

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Abstract

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A fabrication method of a semiconductor device includes forming a mask insulating film having a specified thickness on the top surface of an n-type semiconductor substrate, forming an opening at a specified position in the mask insulating film, carrying out ion implantation with p-type impurity ions onto the top surface, removing a layer portion formed in the mask insulating film with the p-type impurities included by the ion implantation, and carrying out heat treatment to diffuse the p-type impurities implanted into the n-type semiconductor substrate from the opening to a depth, thereby forming the p-type isolation region.

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Patent Owner(s)

Patent OwnerAddress
FUJI ELECTRIC CO LTD1-1 TANABESHIDEN KAWASAKI-KU KAWASAKI-SHI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KAKEFU, Mitsuhiro Matsumoto-city, JP 11 28

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