OPTICAL AND ATOMIC FORCE MICROSCOPY INTEGRATED SYSTEM FOR MULTI-PROBE SPECTROSCOPY MEASUREMENTS APPLIED IN A WIDE SPATIAL REGION WITH AN EXTENDED RANGE OF FORCE SENSITIVITY
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Apr 16, 2015
app pub date -
Dec 13, 2012
filing date -
Dec 16, 2011
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
An optical and atomic force microscopy measurement integrated system is described. The system has an atomic force microscope having a first probe configured to interact with a sample to be analysed, an optical tweezer, a second probe configured to be held in the focus of the optical tweezer, movement means for moving the two probes, measurement means for measuring the variations of position of the two probes and processing means configured to receive, as an input, the measurement signals of the two probes to generate an output signal representative of the sample.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully