METHOD AND APPARATUS FOR ON-THE-FLY MEMORY CHANNEL BUILT-IN-SELF-TEST

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United States of America Patent

APP PUB NO 20150106673A1
SERIAL NO

14054856

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Abstract

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The present invention discloses a memory channel bridge with a BIST module; and the memory channel bridge interfaces other channels in a SOC to access a memory module. During a DFT test, SOC memory channels and the BIST access the memory module concurrently by using an arbiter in the memory channel bridge to arbitrate the traffics from the SOC memory channels and the BIST to ensure the correctness and completeness of the whole design.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78
GLOBAL UNICHIP CORPNO 10 LI-HSIN 6TH ROAD HSINCHU SCIENCE PARK HSINCHU CITY 30078

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Chao Yu Hsinchu City, TW 7 14
Hu, Wen Hsuan Hsinchu County, TW 1 6
Huang, Jung Chi Changhua County, TW 2 6

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