FAST ATOMIC LAYER DEPOSITION PROCESS USING SEED PRECURSOR

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United States of America Patent

SERIAL NO

14514296

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Abstract

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Embodiments relate to an atomic layer deposition (ALD) process that uses a seed precursor for increased deposition rate. A first reactant precursor (e.g., H2O) may be formed as a result of reaction. The first reactant precursor may react with or substitute source precursor (e.g., 3DMAS) in a subsequent process to deposit material on a substrate. In addition, a second reactant precursor (e.g., radicals) may be separately injected onto the substrate previously injected with the source precursor. By causing the source precursor to react with the first reactant precursor from the surface of the substrate and also react with the second reactant provided by the injector, the material is deposited on the substrate in an expedient manner.

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Patent Owner(s)

Patent OwnerAddress
VEECO ALD INC3191 LAURELVIEW COURT FREMONT CA 94538

International Classification(s)

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  • 2014 Application Filing Year
  • C23C Class
  • 2649 Applications Filed
  • 2034 Patents Issued To-Date
  • 76.79 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances2014201520162017201820192020202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hwang, Chang Wan Busan, KR 6 953
Lee, Sang In Los Altos Hills, US 99 6600
Yoon, Jeong Ah Hwaseong-si, KR 6 581

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Patent Citation Ranking

  • 294 Citation Count
  • C23C Class
  • 98.72 % this patent is cited more than
  • 10 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges196909157554014613421801 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0501001502002503003504004505005506006507007508008509009501000

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