SYSTEM AND METHOD FOR DETECTING AND REPAIRING DEFECTS IN AN ELECTROCHROMIC DEVICE USING THERMAL IMAGING
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Apr 9, 2015
app pub date -
Mar 29, 2012
filing date -
Mar 31, 2011
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
System (1) and method (100) for detecting and repairing a defect in an electrochromic device (30) may include acquiring a thermal image of the electrochromic device (30) when the device is in an operating state. In addition, the system and method may include processing thermal imaging data representative of the thermal image to detect a defect in the electrochromic device by comparing a thermal amplitude detected at one or more pixels of the thermal image with a predetermined value, and to determine a location of the electrochromic device corresponding to the detected defect.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully