DIRECT TESTING FOR PERIPHERAL CIRCUITS IN FLAT PANEL DEVICES
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United States of America Patent
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Issued Date -
Apr 9, 2015
app pub date -
Oct 7, 2014
filing date -
Nov 15, 2005
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Abandoned
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Abstract
A method of testing a flat panel display including an array of pixels and a peripheral circuit configured to provide signals to the pixels is disclosed. The method includes applying at least one test signal to the peripheral circuit, acquiring one or more voltage images of the peripheral circuit, and detecting a defect in the peripheral circuit based on the acquired voltage images.
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