X-ray monitoring optical elements
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United States of America Patent
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Dec 27, 2016
Grant Date -
Apr 2, 2015
app pub date -
Sep 30, 2013
filing date -
Sep 30, 2013
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Abstract
An X-ray article and method for analyzing hard X-rays which have interacted with a test system. The X-ray article is operative to diffract or otherwise process X-rays from an input X-ray beam which have interacted with the test system and at the same time provide an electrical circuit adapted to collect photoelectrons emitted from an X-ray optical element of the X-ray article to analyze features of the test system.
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