SYSTEMS AND METHODS FOR DETERMINING THE FAR FIELD SIGNATURE OF A SOURCE IN WIDE AZIMUTH SURVEYS
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United States of America Patent
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Issued Date -
Mar 26, 2015
app pub date -
Sep 25, 2014
filing date -
Sep 25, 2013
priority date (Note) -
Abandoned
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Abstract
Systems and methods for determining the far field signature of a source in wide azimuth surveys are disclosed. The method includes determining a position of a first sensor and a source. The first sensor is attached to a first vessel and the source is attached to a second vessel. The method further includes calculating a reflected incidence angle between the first sensor and the source, determining a position for a second sensor based on a direct incidence angle between the second sensor and the source approximating the direct incidence angle. The method also includes determining a far field signature for the source based on the direct incidence angle.
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