SWITCHED LOAD TIME-DOMAIN REFLECTOMETER DE-EMBED PROBE
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United States of America Patent
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Issued Date -
Mar 26, 2015
app pub date -
Apr 25, 2014
filing date -
Sep 25, 2013
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A de-embed probe, including two inputs configured to connect to a device under test, a memory, a signal generator configured to output a signal, a plurality of load components, a plurality of switches, and a controller. Each load component is configured to provide a different load. A first switch of the plurality of switches is associated with the signal generator and the other switches of the plurality of switches are each associated with one load component. The controller is configured to control the plurality of switches to connect combinations of the loads from the plurality of load components and the signal from the signal generator across the two inputs.
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