SCANNING METHOD WITH ADJUSTABLE SAMPLING FREQUENCY AND TOUCH DEVICE USING THE SAME

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United States of America Patent

APP PUB NO 20150077386A1
SERIAL NO

14304636

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Abstract

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A scanning method with adjustable sampling frequency includes steps of pre-scanning a sensing unit of a touch device to acquire capacitance offsets of sensor traces of the sensor unit aligned in at least one of a first-axis direction and a second-axis direction, determining sampling frequencies according to the capacitance offsets of the respective driven sensor traces, and sampling the sensing unit with the determined sampling frequencies. As the capacitance offsets reflect RC load values corresponding to the sensor traces in the first-axis direction, the sampling frequencies can be adjusted according to the actual RC load values when the sensing unit is scanned to receive sensed signals, thereby effectively raising a report rate of touch events.

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Patent Owner(s)

Patent OwnerAddress
ELAN MICROELECTRONICS CORPORATIONNO 12 INNOVATION 1ST RD SCIENCE-BASED INDUSTRIAL PARK HSIN CHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HUANG, Jung-Shou Zhubei City, TW 18 247
WU, Chia-Mu Taipei City, TW 14 156

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