METHOD FOR MEASURING PERFORMANCE OF A SPECTROSCOPY SYSTEM
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United States of America Patent
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Issued Date -
Mar 5, 2015
app pub date -
Apr 2, 2013
filing date -
Apr 5, 2012
priority date (Note) -
Published
status (Latency Note)
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Abstract
A method of measuring the performance of a spectroscopy system including obtaining a plurality of component spectra for each component of a set of components that are to be identified by the system, the component spectra obtained for variations of at least one factor that affects the component spectrum. Sample spectra and then simulated, each sample spectrum simulated for a corresponding potential sample using at least one different component spectrum and/or a different amount of at least one of the component spectra to that used to simulate the other sample spectra. The sample spectra are analysed to obtain, for each sample spectrum, a measured quantity and/or quality for a characteristic of the corresponding potential sample and a measure of performance generated based upon the measured quantities and/or qualities. The invention also concerns apparatus for carrying out this method.
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