TEST CARRIER, DEFECT DETERMINATION APPARATUS, AND DEFECT DETERMINATION METHOD
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United States of America Patent
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Issued Date -
Mar 5, 2015
app pub date -
May 21, 2013
filing date -
May 23, 2012
priority date (Note) -
Abandoned
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Abstract
A test carrier that temporarily accommodates a die includes: a first wiring pattern that electrically connects an external terminal of the test carrier and a TSV of the die; and a second wiring pattern that electrically connects the TSVs.
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