CONNECTOR, PROBE, AND METHOD OF MANUFACTURING PROBE

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United States of America Patent

SERIAL NO

14528016

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A connector includes multiple probes and a first insulator part and a second insulator part joined to cover the probes. Each of the probes has a monolithic structure of a single bent metal plate. Each of the probes includes an end part configured to come into contact with an electrode terminal; a spring part having a meandering shape and connected to the end part; a housing part bent to enclose the spring part; and a bent part provided between the spring part and the housing part. The end parts of the probes are at least partially projecting outward from first openings provided in the first insulator part, and the bent parts of the probes are at least partially projecting outward from second openings provided in the second insulator part.

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Patent Owner(s)

Patent OwnerAddress
FUJITSU COMPONENT LIMITED12-4 HIGASHI-SHINAGAWA 4-CHOME SHINAGAWA-KU TOKYO 140-0002

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kobayashi, Mitsuru Tokyo, JP 180 2878
Sato, Koki Tokyo, JP 125 897
Takahashi, Koki Tokyo, JP 40 106

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