Identifying and Correcting Hogel and Hogel Beam Parameters
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United States of America Patent
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Issued Date -
Feb 26, 2015
app pub date -
Aug 20, 2013
filing date -
Aug 20, 2013
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Abandoned
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Abstract
Systems and methods include determining whether a parameter of a hogel beam, from a set of hogel beams, is within one or more thresholds. The one or more thresholds are based at least in part on one or more parameters of a first set of hogel beams. In response to the parameter being outside of the one or more thresholds, new values are determined for the parameter based at least in part on one or more parameters from a second set of hogel beams.
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